Journal of Taiwan Agricultural Research

Author:Guang-Jauh Shieh, Bing-Huei Chen, Chan-Lee Ho and Hung-Shung Lu

Abstract:

    The S₂ and S₅ inbred lines derived from eight Tainan-white (TNW) maize populations collected from eight differential areas were evaluated for resistance to Asian corn borer (Ostrinia furnacalis), at Wufeng, Taichung. Artificial infestation of the larve on plant was used in whorl and silking stages of plant development, respectively. The result indicated that the TNW inbred lines with larger genetic variation for Asian corn borer feeding damage in the whorl and silking stages of plant development can be selected for higher resistance. In the diallel cross using Haymans method for analysis, the result indicated that the variations attributed to additive gene amd non-additive gene were highly significantly for Asian corn borer resistanec in whorl stage and silking stage. The additive genetic variance was larger than the non-additive genetic variance. The resistance to Asian corn borer was controlled by 2 and 3 groups of gene in whorl and silking stage of plant development, respectively. The recessive gene might be the one attributing resistance to Asian corn borer because the inbred lines with higher level of resistance have more recessive genes.

Key words:Tainan-white maize, Asian corn borer, Resistance, Genetic variation

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